Atomic force microscopy (AFM) has long served as a cornerstone technique for nanoscale imaging and surface characterisation. Recent advances in noncontact AFM have increasingly harnessed the ...

Scientists at the Department of Energy's Oak Ridge National Laboratory have reimagined the capabilities of atomic force microscopy, or AFM, transforming it from a tool for imaging nanoscale features ...

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

Using localized force-distance curves from AFM, a deep neural network was trained and biologically validated to predict and accurately distinguish macrophage polarization states, including complex ...

Understanding failure modes, mechanisms, and root causes is critical in the manufacturing of semiconductors and electronic devices. Identifying the underlying cause of a failure not only helps prevent ...

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...

Researchers developed and validated a label-free, non-invasive method combining AFM with deep learning for accurate profiling of human macrophage mechanophenotypes and rapid identification of their ...